• Wireless communications test

    Wireless communications test equipment system integrated circuits and reference designs

    Description

    Wireless Communication Test Equipment (WCTE) use configurable RF frontend to test wireless devices to ensure compliance with multiple standards. Our integrated circuits and reference designs help you create a WCTE signal chain that has a high level of integration and low power as channel count increases.

      Modern wireless communication test equipment requires:

    • Direct RF sampling data converters with wide bandwidth and high dynamic range
    • Low jitter multichannel JESD204B compliant clock distribution
    • Efficient power supply that minimizes board area, and improves thermal performance
    • Low EMI power supply that improves system sensitivity and dynamic range
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    Technical documents

    Application notes & user guides

    Application Notes (6)

    Title Type Size (KB) Date
    PDF 429 KB 26 Apr 2017
    PDF 261 KB 17 May 2016
    PDF 82 KB 12 Jan 2016
    PDF 327 KB 10 Sep 2010
    PDF 166 KB 28 Feb 2005
    PDF 273 KB 22 Apr 2004

    Product bulletin & white papers

    White Papers (5)

    Title Type Size (MB) Date
    PDF 4.63 MB 12 Aug 2016
    PDF 3.33 MB 19 Mar 2015
    PDF 1.13 MB 11 Feb 2015
    PDF 91 KB 01 May 2007
    PDF 342 KB 01 Feb 2004

    Technical articles

    Design & development

    Name Part # Company Software/Tool Type
    Data capture/pattern generator: data converter EVM with 16 JESD204B lanes from 1.6-15Gbps TSW14J57EVM Texas Instruments Evaluation Modules & Boards
    Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-12.5Gbps TSW14J56EVM Texas Instruments Evaluation Modules & Boards
    Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-6.5Gbps TSW14J50EVM Texas Instruments Evaluation Modules & Boards

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